Page 19 - december22_112922.indd

TAP TIMES -19- DECEMBER 2022
OCTOBER 2022
TAP TIMES -10-

Test consumables (from 17)
High-power socket design (from 8) will melt. Great care must be taken in the
test program, sense feedback loop and
The heat transfer and convection cooling in test cell operation to prevent over current
growth territory, a
this area is poor, so there is little external
gain for 2022. conditions lasting more than 50ms.
relief for the current/temperature function.
Supercharged Probe lifetime
More robust materials
A supercharged The lifetime of the probes under high-cur-
Increasing the contact surface area, lower-
semiconductor in- rent loads also diminishes as the contact
ing contact resistance, and adding more
dustry has helped resistance increases.
robust materials for the probe tip are the
grow probe card
main ways to address the issue.
revenues but does With high temperature (usually >250°C)
not explain every- at the tips of the probe, tin migrates to the
The expectation though is that the mate-
thing. surface of the probes. Aggressive abrasive
rial and the operation of the probe will be cleaning can reduce the eff ects of the tin
The rapid rise of migration but adds to the tip wear
degraded if high currents are regularly
larger dies with fi n- and smooths the asperities needed to
driven through the probe.
er contact pitches make good contact.
and the explosion
In some conditions, the probe may be
in demand for RF3 Increasing the contact force of the com-
destroyed as well as the surrounding PC
next page
board and socket plastic material, which next page

High Connection Density, Inc.

542 Gibraltar Dr., Milpitas, CA 95035 Phone: 408/739-9700
www.hcdcorp.com - sales@hcdcorp.com
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